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Bibliographic Item (1.0)
- John C Knight & E Ann Myers
- An Improved Inspection Technique
- Comm ACM V36n11(Nov 1993)pp51-61
- =EXPERIMENT SQA INSPECTION DEFECTS
Look for more than defects causing bugs.
Tools to gives views of product, checklists, standards, Highlighted syntax, comments
Phased: specialists, not all at one time, in a planned sequence, also parrallel
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